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    中文版
    JEOL 2100F FEG TEM

      

    Introduction

    The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.

    The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F have been equipped with STEM, EDS, EELS, and CCD-cameras.

    SPECIFICATIONS

    High-brightness Schottky Field Emission Electron Gun

    Probe Size<0.2 nm

    point-to-point TEM resolution is 0.23 nm

    Bright Field and Annular Dark Field detector

    Magnification: x50 to 1,500,000

     

    86-29-82664764

    86-29-82664906

    campnano@gmail.com

    Useful links

    28 West Xianning Rd., The Building of Materials Science and Engineering, Xi'an, Shaanxi, P.R.China 710049

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